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Quantitative (S)TEM analysis of intermediate band solar cell materials

In this thesis the strain properties of two InAs/GaAs quantum dot intermediate band solar cell materials have been explored. Both samples were thin films grown on a (100) GaAs substrate. The quantum dot material was InAs, and the bulk material was GaAs. One sample had AlAs-cap, while the other had GaAs-cap. Geometrical phase analysis was used to study the strain. A higher degree of strain was found in the AlAs-capped sample. Negative strain was observed in directly above and below the quantum dots in both samples. A stacking fault in a quantum dot in the AlAs-capped sample was found to relax all the strain. Analysis of the chemical composition of the AlAs-capped sample was performed using HAADF-STEM and multislice analysis. This analysis found an average indium concentration inside the quantum dots of 25% +- 10%, with peaks up to 50%.

Identiferoai:union.ndltd.org:UPSALLA1/oai:DiVA.org:ntnu-13655
Date January 2011
CreatorsNord, Magnus Kristofer
PublisherNorges teknisk-naturvitenskapelige universitet, Institutt for fysikk, Institutt for fysikk
Source SetsDiVA Archive at Upsalla University
LanguageEnglish
Detected LanguageEnglish
TypeStudent thesis, info:eu-repo/semantics/bachelorThesis, text
Formatapplication/pdf
Rightsinfo:eu-repo/semantics/openAccess

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