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A high resolution x-ray diffractometer for studying crystal epitaxy /

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:r781wg98z
Date January 1987
CreatorsShi, Yushan
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 64010, Proquest: AAIML46120

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