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Untersuchungen zur Diffusion von Eigenpunktdefekten in Silizium und Galliumarsenid

Halle, Universiẗat, Diss., 1999.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76257806
Date January 1999
CreatorsScholz, René F.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageGerman
Detected LanguageGerman

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