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Matching patterns of line segments using affine invariant features

published_or_final_version / abstract / Electrical and Electronic Engineering / Master / Master of Philosophy

  1. 10.5353/th_b3462725
  2. b3462725
Identiferoai:union.ndltd.org:HKU/oai:hub.hku.hk:10722/26563
Date January 2005
CreatorsChan, Chi-ho, 陳子濠
ContributorsLeung, CH, Hung, YS
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Source SetsHong Kong University Theses
LanguageEnglish
Detected LanguageEnglish
TypePG_Thesis
Sourcehttp://hub.hku.hk/bib/B3462725X
RightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works., Creative Commons: Attribution 3.0 Hong Kong License
RelationHKU Theses Online (HKUTO)

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