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Crystallization phenomenon of amorphous germanium film induced by in situ thermal pulse annealing =: 原位熱脈衝退火引發之非晶鍺薄膜結晶現象. / 原位熱脈衝退火引發之非晶鍺薄膜結晶現象 / Crystallization phenomenon of amorphous germanium film induced by in situ thermal pulse annealing =: Yuan wei re mo chong tui huo yin fa zhi fei jing zhe bo mo jie jing xian xiang. / Yuan wei re mo chong tui huo yin fa zhi fei jing zhe bo mo jie jing xian xiang

by Lui Ka Man Raymond. / Thesis (Ph.D.)--Chinese University of Hong Kong, 1996. / Includes bibliographical references (leaves 190-202). / by Lui Ka Man Raymond. / Acknowledgements / Abstract / Table of contents --- p.i / Chapter Chapter 1 --- Introduction / Chapter 1.1) --- General overview --- p.1 / Chapter 1.2) --- The present study --- p.4 / Chapter Chapter 2 --- Theory / Chapter 2.1) --- Introduction --- p.8 / Chapter 2.2) --- Energy transfer from an incoherent radiation source --- p.9 / Chapter 2.3) --- Interaction between photons and solid --- p.11 / Chapter 2.4) --- Probability of a direct transition of amorphous germanium to liquid germanium --- p.12 / Chapter 2.5) --- Crystallization in the supercooled melts and interface stability of the crystallizing front --- p.20 / Chapter A) --- Homogeneous nucleation --- p.21 / Chapter B) --- Heterogeneous nucleation --- p.24 / Chapter C) --- Interfacial stability of the crystallizing front --- p.25 / Chapter Chapter 3 --- Sample preparation / Chapter 3.1) --- Introduction --- p.36 / Chapter 3.2) --- The sample preparation system --- p.36 / Chapter A) --- General description --- p.36 / Chapter B) --- The electron beam source and other components --- p.37 / Chapter C) --- The thermal pulse furnace (TPF) --- p.38 / Chapter 3.3) --- The substrates --- p.41 / Chapter 3.4) --- Sample preparations --- p.42 / Chapter Chapter 4 --- Dendritic crystallization of amorphous germanium on amorphous substrate / Chapter 4.1) --- Introduction --- p.47 / Chapter 4.2) --- Sample preparation and experimental methods --- p.48 / Chapter A) --- Sample preparation --- p.48 / Chapter B) --- Characterization methods --- p.50 / Chapter 4.3) --- Experimental results --- p.54 / Chapter 4.4) --- Discussions --- p.58 / Chapter A) --- Existence of a supercooled semiconductive liquid phase --- p.58 / Chapter B) --- Suppression of nucleation in the supercooled liquid --- p.61 / Chapter C) --- The effect of substrate width on the confinement of <110> crystal axes --- p.63 / Chapter D) --- The effect of annealing ambient --- p.63 / Chapter 4.5) --- Conclusions --- p.65 / Chapter Chapter 5 --- Transport properties of dendritic Ge films / Chapter 5.1) --- Introduction --- p.93 / Chapter 5.2) --- Theory --- p.93 / Chapter A) --- Expression of electrical drift mobility by the relaxation time approximation --- p.94 / Chapter B) --- Electrical drift mobility resulting from ionized impurity scattering --- p.98 / Chapter 5.3) --- Experimental methods --- p.102 / Chapter A) --- Sample annealing --- p.102 / Chapter B) --- Temperature-dependent electrical conductivity measurements (303 K - 523 K) --- p.102 / Chapter C) --- Temperature-dependent Hall mobility measurements (20 K - 300 K) --- p.103 / Chapter 5.4) --- Experimental results --- p.105 / Chapter A) --- Conductivity in the high temperature range K - 303 K --- p.105 / Chapter B) --- Sheet conductance in the temperature range 300K - 20 K --- p.105 / Chapter C) --- Hall mobility in the temperature range 300K to 20 K --- p.107 / Chapter 5.5) --- Discussions --- p.108 / Chapter A) --- Temperature dependence of electical conductivity --- p.108 / Chapter B) --- Temperature-dependent Hall mobility measurements --- p.111 / Chapter 5.6) --- Conclusions --- p.115 / Chapter Chapter 6 --- Crystallization of amorphous germanium film on (001) GaAs wafers / Chapter 6.1) --- Introduction --- p.131 / Chapter A) --- General review --- p.131 / Chapter B) --- The present study --- p.132 / Chapter 6.2) --- Sample preparation and experimental methods --- p.134 / Chapter A) --- Sample preparation --- p.134 / Chapter B) --- Characterization methods --- p.135 / Chapter 6.3) --- Experimental results --- p.143 / Chapter A) --- Epitaxial regrowth of a-Ge films on semi-insulating (001) GaAs --- p.144 / Chapter B) --- Influence of the substrate and the initial thickness of a-Ge film on the process of crystallization --- p.146 / Chapter C) --- Results from electron spectroscopy and EDX dot-map --- p.148 / Chapter D) --- The electrical property of the Ge/GaAs heterojunction --- p.150 / Chapter 6.4) --- Discussions --- p.150 / Chapter A) --- Substrate dependence --- p.150 / Chapter B) --- Sample thickness dependence --- p.153 / Chapter C) --- Regrowth mechanism --- p.154 / Chapter 6.5) --- Conclusions --- p.156 / Chapter Chapter 7 --- Conclusions and suggestions for further studies / Chapter 7.1) --- Conclusions --- p.183 / Chapter A) --- On amorphous substrate [Corning 7059 glass] --- p.183 / Chapter B) --- On crystalline substrate [GaAs (001) wafer] --- p.185 / Chapter 7.2) --- Suggestions for further studies --- p.186 / Chapter A) --- Synthesis of Ge/GaAs heterojunction with abrupt interface --- p.186 / Chapter B) --- Applying the thermal pulse annealing method to other systems --- p.186 / Chapter C) --- Studying the size and shape-dependence of Raman spectrum by using sample with highly uniform grain size and well-defined geometry --- p.187 / Appendix A --- p.188 / References --- p.190

Identiferoai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_321574
Date January 1996
ContributorsLui, Ka Man Raymond., Chinese University of Hong Kong Graduate School. Division of Physics.
PublisherChinese University of Hong Kong
Source SetsThe Chinese University of Hong Kong
LanguageEnglish
Detected LanguageEnglish
TypeText, bibliography
Formatprint, v, 202 leaves : ill. ; 30 cm.
RightsUse of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/)

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