This thesis deals with study homogeneity of thin organic layers using image analysis. The theoretical parts deal with preparation thin layers and some methods examining their surface, especially optical microscopy and profilometry. Optical microscope NIKON ECLIPSE E200, digital camera NIKON 5400 and computer was used for study homogeneity of organic layers by image analysis. Images of the organic layer and single electrodes, which were steamed on organic layer, were surveyed. Homogeneity of surfaces layers was assessed by errors related with common moments (roughness average, root mean square roughness, skewness, and kurtosis). Differences between single samples in connection with size their common moments and homogeneity are discussed at the close of this work.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:216436 |
| Date | January 2008 |
| Creators | Lacinová, Eva |
| Contributors | Vala, Martin, Zmeškal, Oldřich |
| Publisher | Vysoké učení technické v Brně. Fakulta chemická |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0024 seconds