Yes / The possibility of separating the topographical and chemical information in a polymer nano-composite using low-voltage SEM imaging is demonstrated, when images are acquired with a Concentric Backscattered (CBS) detector. This separation of chemical and topographical information is based on the different angular distribution of electron scattering which were calculated using a Monte Carlo simulation. The simulation based on angular restricted detection was applied to a semi-branched PNIPAM/PEGDA interpenetration network for which a linear relationship of topography SEM contrast and feature height data was observed. / EPSRC
Identifer | oai:union.ndltd.org:BRADFORD/oai:bradscholars.brad.ac.uk:10454/11367 |
Date | January 2015 |
Creators | Wan, Q, Plenderleith, R.A., Dapor, M., Rimmer, Stephen, Claeyssens, F., Rodenburg, C. |
Source Sets | Bradford Scholars |
Language | English |
Detected Language | English |
Type | Article, Published version |
Rights | © 2015 The Authors. This Open Access article is distributed under the Creative Commons CC-BY license (http://creativecommons.org/licenses/by/3.0), CC-BY |
Page generated in 0.5843 seconds