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Fourier spectroscopy in the far infrared

An infrared Fourier spectrophotometer has "been set up in the solid state laboratory of the University of British Columbia.
A cryostat has been built and adapted to the spectrometer.
A computer program to analyze the data and plot the spectrum has been written.
As a demonstration of the system's capability, the transmission spectrum from 40 cmˉ¹ to 330 cmˉ¹ of boron doped silicon was obtained for the sample at liquid helium temperature. This spectrum was compared to earlier work done by Colbow in the region 240 cmˉ¹ to 330 cmˉ¹.
A spectrum of boron and indium doped silicon was Investigated in the hope of finding Bˉ and In⁺ ionized centres. These were not found at the impurity concentrations and temperatures used.
A transmission spectrum of intrinsic silicon at liquid helium temperature was obtained for the region 40 cmˉ¹ to 330 cmˉ¹
A comparison of the above spectra suggests that the low energy tail of the boron doped and boron and indium doped samples is due to a frequency dependent value of reflectivity as Is seen from the spectrum for intrinsic silicon. / Science, Faculty of / Physics and Astronomy, Department of / Graduate

Identiferoai:union.ndltd.org:UBC/oai:circle.library.ubc.ca:2429/35094
Date January 1970
CreatorsStrohmaier, Ronald Murray
PublisherUniversity of British Columbia
Source SetsUniversity of British Columbia
LanguageEnglish
Detected LanguageEnglish
TypeText, Thesis/Dissertation
RightsFor non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use.

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