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Low-Cost IP Core Test Using Tri-Template-Based Codes

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Identiferoai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/15029
Date01 January 2007
CreatorsITO, Hideo, ZENG, Gang
PublisherInstitute of Electronics, Information and Communication Engineers
Source SetsNagoya University
LanguageEnglish
Detected LanguageEnglish
TypeArticle(publisher)
RightsCopyright (C) 2007 IEICE

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