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Using IBIS Model for Signal Integrity and EMI Analysis in FDTD Method Simulation

Recently clock rates in digital system reach in GHz range, and therefore EMC problems were occurred. Based on the FDTD modeling approach, signal integrity (SI) and electromagnetic radiation (EMI) for high-speed digital circuits to get accurate results ,including the active IC into FDTD method is the key issue on the printed circuit boards (PCB) are investigated.
IBIS (I/O buffer information specification) model is one of the good choices to show the behavior of digital devices. In this paper we propose the way of linking IBIS model of the active IC into FDTD to study about EMC problem in high-speed PCB. Several examples are demonstrated for checking the accuracy of the approach. By combining with experimental results, the combining method show good accuracy both in SI and EMI.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0723103-122933
Date23 July 2003
CreatorsLin, Yu-Chen
ContributorsJin-Cing Huang, Chih-Wen Kuo, Tzong-Lin Wu, Tzyy-Sheng Horng, Sheng-Fu Jhang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0723103-122933
Rightswithheld, Copyright information available at source archive

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