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A probabilistic model to learn, detect, localize and classify patterns in arbitrary images /

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:w0892f64j
Date January 2008
CreatorsToews, Matthew.
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 114035, Proquest: AAINR51009

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