Return to search

Finite element simulation of VLSI interconnections with application to reliability design optimisation and electromigration modelling

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:334059
Date January 1993
CreatorsTrattles, John T.
PublisherUniversity of Newcastle Upon Tyne
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0014 seconds