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Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction

Thesis (M. Phil.)--University of Hong Kong, 2008. / Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/225869484
Date January 2007
CreatorsChen, Quan,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

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