Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction

Description

Thesis (M. Phil.)--University of Hong Kong, 2008. / Also available in print.

Links & Downloads

1. http://sunzi.lib.hku.hk/HKUTO/record/B3955708X

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/225869484
Date	January 2007
Creators	Chen, Quan,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Click to view the E-thesis via HKUTO