There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Array, Standard Cell, and Full Custom. The objective of this research is to design a VLSI circuit using the Standard Cell approach. A prime requisite for a successful design of these circuits is an integrated Computer Aided Design (CAD) system. The chip design requirements for an integrated CAD system are developed and their interrelationships are presented. As VLSI circuits grow in complexity, the problem of how to test them becomes more difficult. Two methods for testing are defined: 1. Insertion within the system of which the chip is a part, and use of standard system test techniques. 2. Self-test circuitry built into the chip. These testing techniques were used in the VLSI circuit in this report.
| Identifer | oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:rtd-5703 |
| Date | 01 January 1984 |
| Creators | Abidin, Randolph L. |
| Publisher | STARS |
| Source Sets | University of Central Florida |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Retrospective Theses and Dissertations |
| Rights | Public Domain |
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