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Statistical prediction of integrated circuit performance based on circuit design and test structure evaluation

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1. http://hdl.handle.net/1853/15781
2. 449473

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/15781
Date	08 1900
Creators	Gibson, David
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Dissertation
Rights	Access restricted to authorized Georgia Tech users only.