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Analysis of fault coverage masking in built-in self-test schemes

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:2z10wr293
Date January 1985
CreatorsCotsapas, Nicos.
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 63300, Proquest: AAIML23892

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