Return to search

Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction

published_or_final_version / abstract / Electrical and Electronic Engineering / Master / Master of Philosophy

  1. 10.5353/th_b3955708
  2. b3955708
Identiferoai:union.ndltd.org:HKU/oai:hub.hku.hk:10722/51558
Date January 2007
CreatorsChen, Quan, 陳全
ContributorsWong, N, Ng, TS
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Source SetsHong Kong University Theses
LanguageEnglish
Detected LanguageEnglish
TypePG_Thesis
Sourcehttp://hub.hku.hk/bib/B3955708X
RightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works., Creative Commons: Attribution 3.0 Hong Kong License
RelationHKU Theses Online (HKUTO)

Page generated in 0.0025 seconds