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Characterization of organic semiconductor and ferromagnetic half-metallic oxide interface /

Includes bibliographical references (p. 54-56).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/492634123
Date January 2009
CreatorsZhou, Yangyang.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView abstract or full-text.

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