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Study of interfacial phenomena in thin films using photoelectron spectroscopy

Thesis (M.M.S.E.)--University of Delaware, 2006. / Principal faculty advisor: Robert L. Opila, Dept. of Materials Science. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/82141577
Date January 2006
CreatorsMathew, Anoop.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAccess to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file 2.05 Mb., 74 p.

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