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Development of a non-destructive optical method to measure residual stress in thin rectangular samples employing digital image processing

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1. http://hdl.handle.net/1853/20645
2. 426198

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/20645
Date	05 1900
Creators	Allard, Christopher E.
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Thesis
Rights	Access restricted to authorized Georgia Tech users only.