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Mass and optical spectroscopy of CF₄ + O₂ plasmas and their application to the etching of Si, Ge and SiGe alloys

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:358064
Date January 1993
CreatorsChatfield, Robert J.
PublisherUniversity of Bristol
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Sourcehttp://hdl.handle.net/1983/821a17c4-1dad-442b-9179-1f521e571c0f

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