This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are more readable and compact. Test programs can be constructed automatically by merging program fragments using expert-supplied goal-refinement rules and domain-independent planning techniques.
| Identifer | oai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/6830 |
| Date | 01 December 1988 |
| Creators | Shirley, Mark Harper |
| Source Sets | M.I.T. Theses and Dissertation |
| Language | en_US |
| Detected Language | English |
| Format | 307 p., 44859932 bytes, 36329731 bytes, application/postscript, application/pdf |
| Relation | AITR-1099 |
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