Work discusses about the test station in NXP Semiconductors Company in Rožnov pod Radhoštěm. It describes first the test station itself and its possibilities in software libraries testing. Second it describes automatic selftest of this station and sub-steps of this selftest. This work is also used as a documentation for company needs. KEYWORDS
Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:316423 |
Date | January 2017 |
Creators | Kyselý, Tomáš |
Contributors | Dušek, Martin, Povalač, Aleš |
Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
Source Sets | Czech ETDs |
Language | Czech |
Detected Language | English |
Type | info:eu-repo/semantics/masterThesis |
Rights | info:eu-repo/semantics/restrictedAccess |
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