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Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level

Zugl.: Chemnitz, Techn. Univ., Diss., 2009

  1. http://d-nb.info/1000815250/04
Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/642319676
Date January 2009
CreatorsShaporin, Alexey
PublisherChemnitz Univ.-Verl.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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