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Improving reuse of semiconductor equipment through benchmarking, standardization, and automation

Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2006. / Includes bibliographical references (p. 91-92). / The 6D program at IntelĀ® Corporation was set up to improve operations around capital equipment reuse, primarily in their semiconductor manufacturing facilities. The company was faced with a number of challenges, including differing work flows across multiple locations, lack of centralized work flow management, discontinuous inventory information, and other opportunities for cost reduction. The internship was set up to benchmark and explore potential for integration of best known methods, accumulated both inside and outside the company. Based on interviews, research and quantitative analysis, opportunities were identified for reuse of equipment shipping crates, improvement in warehouse inventory management, and changes in labor models to facilitate better knowledge capture and dissemination. As a result of this study IntelĀ® Corporation may realize significant improvement in the areas mentioned in terms of cost reduction, process improvement and knowledge management. By using a flexible approach to problem identification and generating organizational interest in the improvements, recommendations were well received and should lead to eventual adoption. / by Jacob Silber. / S.M. / M.B.A.

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/37235
Date January 2006
CreatorsSilber, Jacob B. (Jacob Bradley)
ContributorsDonald Rosenfield and David H. Marks., Leaders for Manufacturing Program., Leaders for Manufacturing Program at MIT, Massachusetts Institute of Technology. Department of Civil and Environmental Engineering, Sloan School of Management
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Format92 p., application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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