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Electromigration in bamboo aluminum interconnects

Stuttgart, University, Diss., 2000.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/76200971
Date January 2000
CreatorsWitt, Christian.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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