<p>Accelerated life testing (ALT) is
commonly used to obtain the reliability (lifetime) of a system in a short period
by applying severe stress factors (i.e. temperature, humidity, chemical etc.,)
to the system. Accelerated life testing was done on 2N3904 N-P-N bipolar
junction transistor. After accelerated life testing, the acceleration factor is
calculated through statistical analysis to predict the lifetime of a system at
a certain operating condition. Multiple temperature and water immersed
experiments were conducted on transistors at various temperatures. With the
obtained results, analysis was done on the data to predict lifetime of
transistors at different environmental conditions. Effects of the environmental
conditions on the transistors were also discussed. Corrosion effects on
transistors were studied. ALTA software is used to analyze the experimental
data and to calculate the lifetime of the transistors. From the obtained
failure data prediction of mean time to failure at various temperatures was
done. </p>
| Identifer | oai:union.ndltd.org:purdue.edu/oai:figshare.com:article/12770816 |
| Date | 06 August 2020 |
| Creators | Chanakya Varma Surapaneni (9205526) |
| Source Sets | Purdue University |
| Detected Language | English |
| Type | Text, Thesis |
| Relation | https://figshare.com/articles/thesis/Lifetime_prediction_of_transistors_effects_of_temperature_and_water/12770816 |
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