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The Reliability Study of Optical Power and Radiation Pattern for High-Power Light-Emitting Diodes Modules in Aging Test

Light-emitting diodes (LED) illumination takes considerable applications in nowadays daily lives due to the improvement on efficiency of the LED modules. The connections between the reliability and the lifetime, power efficiency, optical spectrum, and structure design of the LED modules are the major research topics.
In this study, high-power LED modules encapsulated with different lens shapes after a thermal-aging test were studied experimentally and numerically. The results showed that the LED modules encapsulated with a hemispherical-shaped plastic lens exhibited a better lifetime due to their better thermal dissipation than those with cylindrical- or elliptical-shaped plastic lenses. In the case of 80¢J aging test, the lifetime of hemispherical-shaped lens was 1.5 times better than the cylindrical- or elliptical-shaped lenses.
Decay of radiation pattern and optical spectrum of high-power LED modules fabricated by different manufacturers after a thermal-aging test were investigated experimentally and numerically. The results showed that the radiation pattern of the LED modules at the two view angles of ¡Ó (15o~75o) decreased more than the other angles as aging time increased. Due to the degradation of lens material after thermal aging, the center wavelength of the LED spectrum shifted 5 nm. Furthermore, the radius curvature of plastic lens was observed 6-70 £gm contraction as aging times increased. Both experimental and simulated results clearly indicated that improving the lens structure and lens material is essential to extend the operating life of the high-power LED modules.
High-power phosphor-converted white-light-emitting diodes (PC-LEDs) with selected concentration and thickness of Ce:YAG phosphor-doped silicones were investigated to study the thermal degradation effect of the Ce:YAG phosphor-silicone layer. The experimental results showed that the lumen loss, chromaticity (CIE shift), and spectrum intensity reduction increased as the concentration of Ce:YAG phosphor doped silicone increased. We showed that 94% lumen loss was attributed to 5.5 wt% Ce:YAG doping and only 6% of the lumen loss was due to a 1mm thickness of silicone degradation. From practical points of view, we found that a lower doping concentration of the Ce:YAG phosphor in thin silicone is a better choice in terms of having less thermal degradation for use in packaging of the high-power PC-LEDs modules and is essential to extend the operating lifetime of the phosphor-based white LED modules.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-1208109-154308
Date08 December 2009
CreatorsTsai, Chun-chin
ContributorsSheng-Lung Huang, Jiang-Jen Lin, Hao-Chung Kuo, Jao-Hua Kuang, Yan-Kuin Su, Wood-Hi Cheng, Shin-Jung Bai, Dong-Sing Wuu, Ann-Kuo Chu
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-1208109-154308
Rightswithheld, Copyright information available at source archive

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