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Reliability study of InGaN/GaN light-emitting diode

Thesis (M. Phil.)--University of Hong Kong, 2009. / Includes bibliographical references (p. 81-89). Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/498621616
Date January 2009
CreatorsLi, Zonglin,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

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