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The automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University

Thesis (M.S.)--Ohio University, November, 1986. / Title from PDF t.p.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/228068347
Date January 1986
CreatorsLee, Hoon-Kyeu.
PublisherOhio : Ohio University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceConnect to resource online

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