Continued aggressive scaling of electronic technology poses obstacles for maintaining circuit reliability. To this end, analysis of reliability is of increasing importance. Large scale number of inputs and gates or correlations of failures render such analysis computationally complex. This paper presents an accurate framework for reliability analysis of logic circuits, while inherently handling reconvergent fan-out without additional complexity. Combinational circuits are modeled stochastically as Discrete-Time Markov Chains, where propagation of node logic levels and error probability distributions through circuitry are used to determine error probabilities at nodes in the circuit. Model construction is scalable, as it is done so on a gate-by-gate basis.
The stochastic nature of the model lends itself to allow various properties of the circuit to be formally analyzed by means of steady-state properties. Formal verifying the properties against the model can circumvent strenuous simulations while exhaustively checking all possible scenarios for given properties. Small combinational circuits are used to explain model construction, properties are presented for analysis of the system, more example circuits are demonstrated, and the accuracy of the method is verified against an existing simulation method.
| Identifer | oai:union.ndltd.org:pdx.edu/oai:pdxscholar.library.pdx.edu:open_access_etds-2860 |
| Date | 30 June 2014 |
| Creators | Blakely, Scott |
| Publisher | PDXScholar |
| Source Sets | Portland State University |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Dissertations and Theses |
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