The automatic test pattern generation in the logic gate level circuits and MOS transistor circuits at Ohio University

Description

Thesis (M.S.)--Ohio University, November, 1986. / Title from PDF t.p.

Links & Downloads

1. http://www.ohiolink.edu/etd/view.cgi?ohiou1183139647

Tags

Logic circuits. Transistor circuits.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/228068347
Date	January 1986
Creators	Lee, Hoon-Kyeu.
Publisher	Ohio : Ohio University,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to resource online