This project successfully designed, fabricated and characterized two highly
reflective distributed Bragg reflectors for use with long wavelength vertical cavity
surface emitting lasers. The first reflector consisted of 20 pairs of alternating
lnP/Ino.64Gao.36Aso.777Po.223 layers grown on an InP substrate with a theoretically predicted
normal incident reflectivity of 96.6% at a center wavelength of 1550nm. The second
DBR had 20 pairs of alternating GaAs/Ino.484Gao.5i6P layers grown on a GaAs substrate
with a theoretically predicted reflectivity of 94.9% at a center wavelength of 1550nm for
normal incident light. Experimental results obtained using a specially designed
reflectivity measurement setup confirmed reflectivity models and predictions at both
normal and variable incident light angles. However, these measurements revealed a
discrepancy between theoretical and experimental layer thickness values for both DBR
structures. Applying perturbations to the theoretical models, the actual layer thicknesses
ofthe DBRs were determined. X-ray analysis was employed to examine the periodicity
of the super-lattices along with the accuracy of lattice matching to the substrate.
Transmission electron microscopy revealed that no detectable drift in layer thickness was
apparent during growth of the DBR structures. Photoluminescence was used to
investigate any compositional variations ofthe quaternary layers in the first DBR stack. / Thesis / Master of Applied Science (MASc)
| Identifer | oai:union.ndltd.org:mcmaster.ca/oai:macsphere.mcmaster.ca:11375/29431 |
| Date | 07 1900 |
| Creators | Mehdi, Shahideh |
| Contributors | Thompson, Dave A. |
| Source Sets | McMaster University |
| Language | English |
| Detected Language | English |
| Type | Thesis |
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