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Investigation of Charge Behavior in Low Viscosity Silicone Liquid by Kerr Electro-optic Field Measurement

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1. http://dx.doi.org/10.1109/TDEI.2010.5412024
2. http://hdl.handle.net/2237/14532
3. 1070-9878
4. Dielectrics and Electrical Insulation, IEEE Transactions on. v.17, n.4, 2010, p.1214-1220

Identifer	oai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/14532
Date	05 August 2010
Creators	Miyagi, Katsunori, Yamagishi, Akira, Endo, Fumihiro, Okubo, Hitoshi, Kato, Katsumi
Publisher	IEEE
Source Sets	Nagoya University
Language	English
Detected Language	English
Type	Article(author)
Rights	© 2010 IEEE. Reprinted, with permission, from Katsumi Kato; Hitoshi Okubo; Fumihiro Endo; Akira Yamagishi; Katsunori Miyagi , Investigation of Charge Behavior in Low Viscosity Silicone Liquid by Kerr Electro-optic Field Measurement, Dielectrics and Electrical Insulation, IEEE Transactions on, Aug/2010