Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy

Description

Thesis (Ph. D.)--University of Hong Kong, 2006. / Title proper from title frame. Also available in printed format.

Links & Downloads

1. http://sunzi.lib.hku.hk/hkuto/record/B36537524

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/85497424
Date	January 2005
Creators	Ma, King-man, Simon.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Click to view the E-thesis via HKUTO