New optical designs have necessitated using refractive index data that is accurate to the third and fourth decimal points. Prism coupling refractometry could be attractive for this task because of a combination of factors. It allows for a direct assessment of the refractive index like interferometry or the minimum deviation method while being quick and convenient, like Kramers-Krönig analysis and spectroscopic ellipsometry. However, the accuracy, precision, and repeatability of this technique have not been revisited recently in the literature. This thesis seeks to identify the critical features of this technique that define its uncertainties and then provides some initial improvements to this system. The improvements explored are hardware-based and incorporate a novel approach to fitting this data. The resulting error budget defined by this strategy increases the measured precision, taking the first step towards making the method a standard metrology technique suitable for the shop floor.
| Identifer | oai:union.ndltd.org:ucf.edu/oai:stars.library.ucf.edu:etd2023-1080 |
| Date | 01 January 2023 |
| Creators | Howe, Andrew W |
| Publisher | STARS |
| Source Sets | University of Central Florida |
| Language | English |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | Graduate Thesis and Dissertation 2023-2024 |
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