Surface-enhanced Raman scattering (SERS) effect on Ag films with different morphology is studied. We varied the deposition rates and also proposed a new method to control the nano-gaps on the silver island film. By bending the glass substrates during film deposition, we can control the gap width on the fractal Ag film. The measured SERS intensity is related to the metal film morphology and we found that the gap width is the dominant factor to analyze the SERS signal. The 3-layer metal-insulator-metal structure is simulated and the E-field intensity with different gaps fits to our measurement results.
| Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0822112-185441 |
| Date | 22 August 2012 |
| Creators | Lu, Yu-Chun |
| Contributors | Min-Hsiung Shih, Yu-Ju Hung, Chao-Kuei Lee |
| Publisher | NSYSU |
| Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
| Language | Cholon |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0822112-185441 |
| Rights | user_define, Copyright information available at source archive |
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