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Design and optimization of RF test structures for mm-wave circuit design

This work discusses a methodology developed for robust RF test structure design for SiGe HBTs operating at mm-wave frequencies.

Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/42922
Date18 November 2011
CreatorsMills, Richard P., III
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageEnglish
TypeThesis

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