Modeling and simulation of negative bias temperature instability : degradation of field-effect transistors /

Description

Zugl.: Wien, Techn. University, Diss., 2007. / Hergestellt on demand.

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1. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=018972469&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/634091725
Date	January 2010
Creators	Entner, Robert.
Publisher	Saarbrücken : VDM Verlag Dr. Müller,
Source Sets	OCLC
Language	English
Detected Language	English