Radiation-hardened-by-design area-efficient all NMOS memory design /

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Thesis (M.S.)--University of Texas at Dallas, 2007. / Includes vita. Includes bibliographical references (leaf 59)

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/191869299
Date	January 2007
Creators	Kim, Jung Eui,
Source Sets	OCLC
Language	English
Detected Language	English