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Critical dimensions of strategy : industry scope shift and reserve strategy trace

Thesis (S.M.M.O.T.)--Massachusetts Institute of Technology, Sloan School of Management, Management of Technology Program, 2004. / Includes bibliographical references (leaves 80-83). / We would like to propose two critical dimensions for strategy: "Industry Scope Shift" and "Reverse Strategy Trace." Recent changes in the progress of information technology and economic globalization raised the importance of these dimensions. Rapid progress in information technology requires firms to respond to the changes of scope including market and product. The execution speed is increasingly becoming critical to keep uniqueness of product and service offerings. Industry Scope Shift helps the capturing of these changes into strategy. Economic globalization demands the organizational challenge to manage conflicts between local market responsiveness and global operation efficiency. Reverse Strategy Trace gives a clear perspective to analyze emergent strategy to accumulate organizational learning from business operations. We will examine the importance of these two dimensions and provides answers when and why these are critical in the strategy planning process. / by Yasuhiko Kiuchi. / S.M.M.O.T.

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/17864
Date January 2004
CreatorsKiuchi, Yasuhiko, 1962-
ContributorsArnoldo C. Hax., Massachusetts Institute of Technology. Management of Technology Program., Management of Technology Program., Sloan School of Management
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Format83 leaves, 4079443 bytes, 4086933 bytes, application/pdf, application/pdf, application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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