Radiation hardness study of high purity silicon and the development of a radiation damage monitoring system for silicon devices in mixed radiation fields /

Description

Thesis (Ph.D.)--University of Wollongong, 2003. / Typescript. Bibliographical references: leaf 261-284.

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1. http://www.library.uow.edu.au/adt-NWU/public/adt-NWU20040727.132611/index.html

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/224029155
Date	January 2003
Creators	Reinhard, Mark.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Access electronically