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Defect characterization of erbium doped silicon light emitting diodes

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994. / Includes bibliographical references (leaves 86-88). / by Rita Gupta. / M.S.

Identiferoai:union.ndltd.org:MIT/oai:dspace.mit.edu:1721.1/11695
Date January 1994
CreatorsGupta, Rita, 1970-
ContributorsLionel C. Kimerling., Massachusetts Institute of Technology. Dept. of Materials Science and Engineering
PublisherMassachusetts Institute of Technology
Source SetsM.I.T. Theses and Dissertation
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Format88 leaves, 6248000 bytes, 6247760 bytes, application/pdf, application/pdf, application/pdf
RightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission., http://dspace.mit.edu/handle/1721.1/7582

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