Highly accurate dimensional metrology via microscopy based vision system /

Description

Thesis (Ph.D.)--Tufts University, 1999. / Adviser: Haris Doumanidis. Submitted to the Dept. of Mechanical Engineering. Includes bibliographical references (leaves 201-207). Access restricted to members of the Tufts University community. Also available via the World Wide Web;

Links & Downloads

1. http://ezproxy.library.tufts.edu/login?url= http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:9925947

Tags

Measurement.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/190833693
Date	January 1900
Creators	Durvasula, Ravi Shankar.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to Dissertations & Theses @ Tufts University.