The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofware tool Tessent Memory BIST. The main purpose is to get familiar with memory testing and to create a design for testing on a specific chip which after its implementation on the chip will retain the original features and functions. Subsequently, the tool is evaluated on its usability.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:377100 |
| Date | January 2018 |
| Creators | Sedlář, Jan |
| Contributors | Fujcik, Lukáš, Hejátková, Edita |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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