The goal of this work is to understand types of defects in semiconductor memories and algorithms for their testing. In the second part the work describes design and implementation of programmable BIST controller with small digital block size requirments.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:316440 |
| Date | January 2017 |
| Creators | Vykydal, Lukáš |
| Contributors | Kovalský, Jan, Kubíček, Michal |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0018 seconds