Return to search

Soft error rate determination for nanometer CMOS VLSI circuits

Thesis--Auburn University, 2008. / Abstract. Vita. Includes bibliographical references (p. 78-89).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/320817997
Date January 2008
CreatorsWang, Fan, Agrawal, Vishwani D.,
PublisherAuburn, Ala.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0014 seconds