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Characterization of oxygen and carbon effects in silicon material and MOSFET devices

Graduation date: 1990

Identiferoai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/38231
Date20 February 1990
CreatorsHaddad, Homayoon
ContributorsForbes, Leonard
Source SetsOregon State University
Languageen_US
Detected LanguageEnglish
TypeThesis/Dissertation

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