Accurate treatment of interface roughness in nanoscale double-gate metal oxide semiconductor field effect transistors using non-equilibrium Green's functions

Description

Thesis (M.S.)--Ohio University, March, 2004. / Title from PDF t.p. Includes bibliographical references (leaves 61-62).

Links & Downloads

1. http://www.ohiolink.edu/etd/view.cgi?ohiou1176318345

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/222017131
Date	January 2004
Creators	Fonseca, James Ernest.
Publisher	Ohio : Ohio University,
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to resource online