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Statistical SPICE parameter extraction for an N-Well CMOS process /

Thesis (M.S.)--Rochester Institute of Technology, 1995. / Typescript. Includes bibliographical references (leaves 91-93).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/34099215
Date January 1995
CreatorsHildreth, Scott A.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceOnline version of thesis

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